Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) at the AIC

Starting in August 2019, the Advanced Imaging Center (AIC) introduced its first pre-commercial electron microscope. This system is based on work done in Janelia’s Hess lab and makes use of a powerful technique: Focused Ion Beam Scanning Electron Microscopy (FIB-SEM). This is the first in a series of blog posts that introduces this unique methodology, and the various considerations that should be made, to prospective AIC users.